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Structural and Ellipsometric Properties of Gas(X)Se(1-X) Layered Mixed Crystals

Oluşturulma Tarihi: 19-12-2017

Niteleme Bilgileri

Tür: Tez

Alt Tür: Yüksek Lisans Tezi

Yayınlanma Durumu: Yayınlanmamış

Dosya Biçimi: PDF

Dil: İngilizce

Konu(lar): Fizik,

Yazar(lar): Habaibi, Om-Alhana S. Ali (Yazar),

Emeği Geçen(ler): Korkmaz Özkan, Filiz (Danışman),

Anahtar Kelimeler

GaSe, GaS, Ellipsometry, Layered crystals, Structural properties


Özet

GaSxSe1-x layered mixed crystals were investigated using structural and optical characterization techniques. Structural characterization of samples grown by Bridgman method were accomplished using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS) and fourier transform infrared (FTIR) spectroscopy techniques. Compositional dependence of mixed crystals were obtained from EDS experiments. Results of measurement indicated that used samples correspond to composition of x varying from 0 to 1 by 0.25 intervals. The crystal structures of the samples were revealed using the results of XRD measurements and a software program for analyses. FTIR spectra of the samples indicated the presence of multiphonon absorptions in the samples for compositions of x = 0, 0.25 and 0.50. The results of XRD and FTIR experiments were associated between the used compositions.Optical characterization of the samples were achieved by ellipsometry experiments carried out in the spectral range of 1.2-6.0 eV. The output data of measurement system were converted to data presenting the spectral dependency of optical parameters. Ellipsometric data was used to obtain the band gap energy of the samples. Obtained band gap energy values showed that as sulfur composition is increased in the mixed crystals, band gap energy increases from 2.04 eV (x = 0) toiv2.57 eV (x = 1). According to revealed band gap energy values, a graph presenting the compositional dependence of bang gap energy was plotted.


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